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Joint Seminar & Colloquia

Ultrastrong Coupling in Condensed Matter

by: Prof. Junichiro Kono

Date: Friday March 12, 2021

Time: 10:00 am – 11:00 am

Location: Zoom Meeting

Overview

Ultrastrong Coupling in Condensed Matter

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Joint Seminar & Colloquia

Doing Business with the Air Force Office of Scientific Research

by: Mr. Edward J Lee

Date: Monday March 04, 2019

Time: 2:15 pm – 2:45 pm

Location: Houston Science Center – Building 593 — Room 102

Overview

Doing Business with the Air Force Office of Scientific Research

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Joint Seminar & Colloquia

Doing Business with the Air Force Office of Scientific Research

by: Dr. Kenneth Goretta

Date: Monday March 04, 2019

Time: 2:15 pm – 2:45 pm

Location: Houston Science Center – Building 593 — Room 102

Overview

Doing Business with the Air Force Office of Scientific Research

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Joint Seminar & Colloquia

Confined Metals

by: Dr. Michael Ruck

Date: Monday August 24, 2009

Time: 12:00 pm – 1:00 pm

Location: Houston Science Center – Building 593 — Room 102

Overview

Not available.

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Joint Seminar & Colloquia

An X-ray Vision of Structure-Function Relationships in Organic Electronics and Biointerfaces

by: Dr. Bert Nickel

Date: Thursday May 08, 2008

Time: 4:00 pm – 5:00 pm

Location: Houston Science Center – Building 593 — Room 102

Overview

Organic molecules exhibit remarkable self-assembly properties which allow them to form highly organized thin film structures. A prominent example for such ultrathin films are lipid bilayers, which represent the structural backbone of cell membranes. Lipid bilayers can be deposited on various substrates ranging from optical resonators to semiconducting layers, permitting the addition of bioselectivity to such devices. I discuss how synchrotron x-ray based techniques can be used to access the structure of such hybrid systems. Another example to be discussed is molecular thin films for organic electronics. Here, I discuss how to determine details of the molecular arrangement, as well as the nature of structural defects, and how they relate to electronic device characteristics such as trap densities.

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