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Materials Characterization Facility

Lab Name: Materials Characterization Facility (MCF)

Lab Contact: Prof. Meen

Lab Website: Materials Characterization Facility

Lab Brochure: Materials Characterization Facility

Lab Description: A well-staffed Materials Characterization Facility (MCF) serves TcSUH laboratories and research groups with expertise in electron microanalysis, measurement of materials microstructures, and high pressure-high temperature synthesis. MCF equipment and capabilities include a JEOL 2000 FX transmission electron microscope, a JEOL 2010SFX scanning transmission electron microscope, a JEOL JXA-8600 electron microprobe, a JEOL JSM 6330F Scanning electron microscope, a Seimens D5000 X-ray diffractometer, a Seimens GADDS X-ray diffractometer, a Netzsch 402C Dilatometer, and additional analytical support from stand-alone high-temperature phase equilibria and x-ray diffraction laboratories.

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